Publications – 1998


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1998

  • 96. J. Schäfer, A.P.Young, L.J. Brillson, H. Niimi, and G. Lucovsky, “Characterization of the Interface Between Plasma-Oxidized SiO2 and Crystalline Silicon by Cathodoluminescence Spectroscopy (CLS),” Extended Abstracts of the 1998 International Conference on Solid State Devices and Materials, Hiroshima, pp.134-135 (1998).