189. J.W. Cox, G.M. Foster, A. Jarjour, H. von Wenckstern, M. Grundmann, and L.J. Brillson, “Defect Manipulation to Control ZnO Micro-/Nanowire-Metal Contacts,”Nano Lett. 18, 6974 (2018). DOI: 10.1021/acs.nanolett.8b02892
188. I.V. Pinchuk, T.J. Asel, A. Franson, T. Zhu, Y.-M. Lu, L.J. Brillson, E.Johnston-Halperin, J.A. Gupta, and R.K. Kawakami, “Topological Dirac Semimetal Na3Bi Films in the Ultrathin Limit via Alternating Layer Molecular Beam Epitaxy,”APL Materials 6, 086103 (2018). https://doi.org/10.1063/1.5041273
187. T.J. Asel, E. Yanchenko, X. Yang, S. Jiang, K. Krymowski, Y. Wang, A. Trout, D.W. McComb, W. Windl, J.E. Goldberger, and L.J. Brillson, “Identification of Ge vacancies as electronic defects in methyl- and hydrogen-terminated germanane,”Appl. Phys. Lett. 113, 061110 (2018). (Editor’s Pick) https://doi.org/10.1063/1.5034460
186. I.J.T. Jensen, K.M. Johansen, W. Zhan, V. Venkatachalapathy, L. Brillson, A.Yu. Kuznetsov, and Ø. Prytz, “Bandgap and band edge positions in compositionally graded ZnCdO,”J. Appl. Phys. 124, 015302 (2018). doi.org/10.1063/1.5036710
185. D. Lee, H. Wang, B.A. Noesges, T. Asel, J. Pan, Q. Yan, L. Brillson, X. Wu, and C.-B. Eom, “Identification of a functional point defect in SrTiO3,”Phys. Rev. Materials, 2, 060403(R) (2018). DOI: 10.1103/PhysRevMaterials.2.060403
184. H. Gao, S. Muralidharan, N. Pronin, Md.R. Karim, S.M. White, T. Asel, G. Foster, S. Krishnamoorthy, S. Rajan, L.R. Cao, M. Higashiwaki, H. von Wenckstern, M. Grundmann, H. Zhao, D.C. Look, and L.J. Brillson, “Optical Signatures of Deep Level Defects in Ga2O3,”Appl. Phys. Lett. 112, 242102 (2018). doi.org/10.1063/1.5026770
183. H. Lee, N. Campbell, J. Lee, T.J. Asel, T.R. Paudel, H. Zhou, J.W. Lee, B. Noesges, J. Seo, B. Park, L.J. Brillson, S.H. Oh, E.Y. Tsymbal, M.S. Rzchowski, and C.B. Eom, “Direct observation of a two-dimensional hole gas at oxide interfaces,”Nature Materials 17, 231-236 (2018). https://doi.org/10.1038/s41563-017-0002-4
182. A. Jarjour, J.W. Cox, W.T. Ruane, H. Von Wenckstern, M. Grundmann, and L.J. Brillson, “Single Metal Ohmic and Rectifying Contacts to ZnO Nanowires: A Defect Based Approach,”Ann. Phys. (Berlin), 530, 1700335 (2018). DOI: 10.1002/andp.201700335