Alumni

Shengnan Zhu

zhu.2670@osu.edu

Shengnan Zhu received her B.S. and M.S. degrees in Optical and Electronic Information Engineering from The Huazhong University of Science and Technology (Wuhan, China) in June 2014, and June 2017, respectively. She has been a member of the OSU ECE WBG group since September 2019. Her research interests include SiC power MOSFETs reliability, and SiC power devices design, fabrication, and characterization. She is currently working on the Reliable SiC power MOSFET design methodology for the II-VI project and the Methodologies for identification of SiC MOSFET failure modes through accelerated tests for the FORD project, among others.

Tianshi Liu

liu.2876@osu.edu

Tianshi Liu received his M.S. and B.S. degree in the Electrical and Computer Engineering Department at The Ohio State University in May 2018 and December 2015 respectively. He has been an OSU ECE WBG member since 2018 pursuing his research interests in SPICE modeling, SiC CMOS, and oxide reliability of SiC MOS devices. He is currently working on the SMART SiC Power ICs project.

 

Susanna Yu 

yu.2452@osu.edu

Susanna Yu received her M.S. and B.S. degree in the Electronic Materials Engineering at Kwangwoon University in June 2016 and June 2014 respectively. She has been an OSU ECE WBG member since 2018 pursuing her research interests of design, process, and analysis of wide-bandgap power semiconductors and the reliability of power devices. Her current projects include methodologies for identification of SiC MOSFET failure modes through accelerated tests from FORD motor company and reliable SiC power MOSFET design methodology from II-VI Foundation.

 

Diang Xing

xing.174@osu.edu

Diang Xing received his his M.S. degree in the Electrical and Computer Engineering Department at The Ohio State University in December 2017 and his B.S. degree in the Electrical Engineering Department at Clemson University in May 2016. He has been an OSU ECE HVPE and WBG member since 2018 pursuing his research interests of SiC MOSFET evaluation and power conversion. He currently works on the Sandia and PowerAmerica projects.

 

John Viront 

viront.2@osu.edu

John Viront is pursuing his B.S in Electrical and Computer Engineering from The Ohio State University. He has been an OSU ECE WBG member since October 2019, and he is pursuing his research interests which include MOSFET SPICE modeling and MOSFET switching capabilities. Currently he is running LTSPICE simulations for 1.2kV MOSFET gate drivers, constructing dv/dt test setups for slew rate reliability, and performing laboratory measurements for the WBG group.

 

Kezia Namenyi 

namenyi.9@osu.edu

Kezia Namenyi is pursuing her B.S. in Electrical and Computer Engineering at The Ohio State University. She has been an OSU ECE WBG member since May 2020 pursuing her research interests in reliability of SiC devices. She is currently working on methodologies for identification of SiC MOSFET failure modes using accelerated tests from FORD motor company.

 

 

Norman Guo

guo.1407@osu.edu

Norman Guo is pursuing his B.S in Electrical and Computer Engineering at The Ohio State University with focus on Electronics or Controls. He has been an OSU ECE WBG member since January 2019 pursuing his research interests in semiconductors, renewable energy, automation, and robotics.

 

 

Chao-Yi Chien

chien.144@osu.edu