Nanoscale Electronic Materials Laboratories
Equipment/Facilities (XPS,CLS,AFM…) User Fees
Oxide Growth & in situ Characterization
Physics Research Building 2175
Oxygen Plasma-assisted Molecular Beam Epitaxy (MBE)
|
X-ray & Ultraviolet Photoemission Spectroscopy (XPS/UPS)
|
Depth-resolved Cathodoluminescence Spectroscopy (DRCLS)
|
Nanoscale Electronic Materials Lab
Dreese Laboratories 020
Scanning Electron Microscope (SEM) – Depth-resolved and Micro-cathodoluminescence Spectroscopy
|
SEM Nanomanipulators – Nanoscale Biasing, Dielectric Breakdown, and Defect Movement
|
Scanned Probe Microscopy and Spectroscopy (KPFM/SPS)
|
Near-nanoscale Defect Spectroscopy
Caldwell Laboratories 320
Low Voltage Surface-Sensitive DRCLS
|
Temperature- & Atmosphere-controlled Photoluminescence Spectroscropy
|