In order to understand and control the macroscopic properties of novel materials, it is important to study the microscopic electronic structure which governs them. By measuring the energy (E), momentum (k) and spin (s) of the electrons propagating inside a material, we can create a ‘map’ of the allowed electronic states known as electron band structure. Angle Resolved Photoemission Spectroscopy (ARPES) is a technique based on the photoelectric effect where a sample surface is irradiated with high energy (~20-1000 eV) radiation. The kinetic energy and angular distribution of the resulting photoelectrons is analyzed, allowing for a momentum-resolved measurement of the density of occupied electron states near the Fermi level i.e. band structure. Our collaboration with Dr. Eli Rotenberg and other scientists on the MAESTRO beamline (7.0.2) at the Advanced Light Source of Berkeley National Lab gives our lab access to state of the art micro- and nano-ARPES facilities. This allows us to study electronic structures of thin films as well as nano-electronic devices.
| Science | Surface Science … | Angle Resolved Photoemission Spectroscopy (ARPES)