Device Characterization Lab
Karl Suss probe stations with a temperature controller
Lake Shore TTP4 Cryogenic Probe Station
Agilent 4142 spectrum analyzer
4156C semiconductor parameter analyzer
4284A LCR meter
DIVA D-265, etc. The system can perform DC, CV (20 Hz to 1 MHz), pulsed-IV (down to 200 ns),
Small signal (45 MHz to 50 GHz), noise ( up to 18 GHz), with 8510C network analyzer
Large signal load-pull (1.8 to 18 GHz) measurements, with Focus Microwave Automatic Load-Pull Tuners
N8975A noise receiver
Campus Labs
OSU Nanotech West Laboratory