One Bit is (Not) Enough: An Empirical Study of the Impact of Single and Multiple Bit-Flip Errors
Behrooz Sangchoolie*, Karthik Pattabiraman+, Johan Karlsson* (IFIP-2017) Abstract— Recent studies have shown that technology and voltage scaling are expected to increase the likelihood that particle-induced soft errors manifest as multiple-bit errors. This raises concerns about the validity of using single…
