What is Atomic Force Microscopy (AFM)?
AFM is a scanning probe-based technique that can provide high-resolution topographical imaging of materials. Besides microscopic images AFM can also provide information on sample stiffness, adhesiveness, surface charge as well as magnetic properties.
We have a multi-user AFM shared facility (funded by a NIH S10 award) comprising of the Bruker Resolve AFM, coupled to an inverted light microscope.
The Bruker Resolve AFM is especially amenable for biological samples and can perform:
- AFM analysis in air and in fluid environment
- AFM and fluorescence microscopy on the same sample
- AFM imaging in contact mode, tapping mode and the new Peak Force tapping mode
- AFM nanomechanics
- Kelvin Probe Force Microscopy (KPFM)
- Magnetic Force Microscopy (MFM)